Optical constants from mirror reflectivities measured at synchrotrons
Abstract
Improved mirror reflectivity measurement techniques have been introduced to permit more accurate determinations of optical constants (delta) and (beta) in the complex index of refraction n equals 1 - (delta) - i(beta) over the energy range 50 to 5000 eV. When the density has been determined by x-ray or other means, one can calculate the real and imaginary parts, f equals f(subscript o) + f' + if' from (delta) and (beta) . Preliminary results are given for the Ni LIII edge around 852 eV, and the Au M edge region from 2150 to 3500 eV. Since these are first experimental evaluations of (delta) for these element edges, they are compared with appropriate reservations to semi-empirical tabulations. There is much potential for this technique applied to synchrotron sources.
- Publication:
-
Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography
- Pub Date:
- January 1993
- DOI:
- 10.1117/12.140603
- Bibcode:
- 1993SPIE.1742..219B
- Keywords:
-
- Mirrors;
- Optical Properties;
- Optical Reflection;
- Synchrotron Radiation;
- X Ray Sources;
- Fresnel Reflectors;
- Optical Materials;
- X Ray Astrophysics Facility;
- Optics